JED2MCT Plus is a software package that translates the output of ACUGEN Software's AADELAY TM AC testing package into a MCT PLD TEMPLATE data file and ASCII Functional File(s). When JED2MCT Plus is used with the ATGEN ® test generator and AADELAY software, PLD test program development for the MCT 2000, 2010, 2020, or 2030 test system is truly automated. JED2MCT Plus is easy to use and will produce test programs that will verify PLDs for DC Parametric, Functional, and AC Parametric compliance.
JED2MCT Plus translates the .JDL file into a PLD Template data file for use with MCT's PLD TEMPLATE1 software package. The PLD Template data file contains all the information required to perform DC parametric, functional, and AC parametric testing.
JED2MCT Plus also translates the .JDL file into ASCII Functional Files which can be converted into loadable functional files using the functional file assembler (FUNCASM) provided with the MCT 2000 Series test system. The ASCII Functional Files contain test adaptor pin mapping information and the test vectors necessary to functionally achieve the ATGEN reported PLD fault coverage. Each ASCII Functional File can be fully commented with the JDL test vectors.
JED2MCT Plus will typically translate a .JDL (JEDEC with DeLays) file into a PLD Template data file and ASCII Functional File(s) in under one minute when running on a 10Mhz IBM AT or compatible.
AC Parametric Testing
JED2MCT Plus will automatically create the AC parametric test section of the PLD Template Data File to verify a PLDs compliance with its tPLH, tPHL, tPLZ, tPHZ, tPZL, and tPZH specifications. The end user can specify the number of propagation delay tests to perform on each output pin. All AC test limits are determined by the delay, phase, and settling time data obtained from the AADELAY .JDL file. The .JDL file data enables JED2MCT Plus to create AC tests for PLD designs with complex feedback paths, I/O switching, etc., as effortlessly as AC tests for simple PLD designs.
The test system's functional edge strobe is used to quantify all propagation delay times. A custom binary search algorithm (MCTTIME) is provided with the MCT PLD TEMPLATE software to ensure fast and accurate AC test results. This eliminates problems associated with using the AC PMU for propagation delay measurement, e.g., I/O state switching, multiple input pin stimulus, and multiple single-pin output state transitions.
JED2MCT Plus provides full control over the tester's active loads through the use of parameter files. Each AC test can effectively have the output pins connected to a pull-up load, a pull-down load, both a pull-up and pull-down load, or no load.
All PLD Template data files contain a header section which documents the translation process, test system requirements, test adaptor requirements, which JEDEC/JWV/JDL file was used, which pin mapping file was used, the programmer, as well as several lines of user-supplied comments. A message file is also created which documents the entire translation process.
Technical Support Service and Updates
Technical support is provided under the support plan for your particular ATGEN base product.
Unlimited PLD Support
JED2MCT Plus comes with more than 50 ASCII parameter files for both commercial and military PLDs. These parameter files contain the DC and AC parametric test conditions and DC parametric test limits for the PLD. The user can modify these files to meet their needs or create new parameter files using a text editor. JED2MCT Plus comes with detailed instructions on how to create your own parameter files for any PLD.
JED2MCT Plus requires the MCT PLD TEMPLATE software package which can be purchased directly from Micron Component Technology, Inc.